EDAX Blog Finding happiness in microscopy

Matt Nowell, EBSD Product Manager, Gatan/EDAX Recently, I analyzed a customer sample using spherical indexing in EDAX OIM Matrix to improve indexing performance on a shot-peened nickel alloy. Rather than just jumping into the electron backscatter diffraction (EBSD) work, I started with the sample in a typical geometry for scanning electron microscope (SEM) imaging (e.g., [...]