JEOL has developed a new Focused Ion Beam (FIB) solution for the preparation of specimens prior to observation in the Transmission Electron Microscope (TEM). The new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging, and EDS analysis in a single instrument. High-quality fast TEM sample preparation The new...The post New FIB-SEM delivers fast, atomic resolution STEM sample preparation appeared first on Research & Development World.
