Malvern Panalytical Blog Ultra-fast crystal orientation on display at CS International 2025

At the heart of semiconductor manufacturing are single-crystal substrate materials with carefully controlled composition. Across the steps in the process in creating these materials, from seeding and crystal growth to grinding, cutting, polishing, and final control, fast and precise crystal orientation control is critical for cost-efficient production. X-ray diffraction (XRD) is a proven analytical method for materials [...]Source