Spea: Scan Options from JTAG for SPEA Testers

See SPEA at SEMICON West, Booth #1929 VOLPIANO, ITALY - SPEA and JTAG Technologies announce their technology collaboration to dramatically improve the integration of boundary scan options within flying probe and bed-of-nails testing equipment. The combination of in-circuit test with boundary scan technology can be the best solution to answer the quality requirements of many highly integrated digital designs: Many of the modern PCB assemblies contain one or more devices with a JTAG interface. Typically this makes it possible to drive and sense nets on the PCB assembly to which the I/O pins of those devices with JTAG are connected, without the necessity to have physical access on those nets and pins. Adding boundary scan capabilities to in-circuit testing will increase fault coverage of interconnections, logic parts and in-signal passives. It will also frequently reduce fixture costs for bed-of-nails systems, due to test point number reduction. New JTAG Technologies boundary scan controllers are now available for the SPEA families of flying probe and bed-of-nails ICT testers. Based on the highly successful JT37x7 architecture from JTAG Technologies, a new version of the QuadPod (JT2147/SAM/FXT-3030) has been developed which perfectly fits in the system rack of a 3030. For the integration of the 40x0 flying probe testers, a complete new controller (JT3703/USB) has been developed. Its compact dimensions allow it to be fitted on one of the flying axes, and connected to a Multi Probe Unit. The integration is not limited to the addition of the JTAG Technologies controller to the tester configuration: Test application development and test execution are fully optimized in order to avoid redundant tests, and can be completely carried out via SPEA Leonardo operating system software. Benefits: Increased test coverage Reduced test time on Flying Probers with optimized BSC+FPT Test program Reduced board handling Test operators already familiar with SPEA Leonardo GUI SPEA Digital channels used in combination with Boundary scan Drive and Sense Pure Boundary scan applications can already be validated and used before fixture is available Target boards can be tested with fewer test pads Would you like to learn more about Boundary Scan options on SPEA Testers? Please, don't hesitate to contact us! From vehicles to smartphones, from tablets to the most complex aerospace, medical, defense devices. With SPEA equipment, semiconductor and electronics manufacturers can ensure, day by day, the quality and reliability of their products. Learn more at www.spea.com.