Xcerra: Enhancing Test Floor Performance and Quality: MT2168 Test Handler with Advanced Double Device Detection and Automatic Temperature Calibration

Xcerra has added two new optional features to the MT2168 XT pick-and-place handler. Both options target optimization of test floor processes, allowing the customer to deliver enhanced quality: the Double Device Detection (DDD) option increases binning integrity; the Automatic Temperature Calibration enables the customer to meet quality standards by calibrating as scheduled without time consuming [...]The post Enhancing Test Floor Performance and Quality: MT2168 Test Handler with Advanced Double Device Detection and Automatic Temperature Calibration appeared first on Evaluation Engineering.